2nd Erlangen School on Atom Probe Tomography
2nd Erlangen School on Atom Probe Tomography taking place from March 4-8.
This multi-day intensive course provides an introduction to high field physics, atom probe
instrumentation, sample preparation and data interpretation to the novice and intermediate level atom prober. As an outcome, the participants will be able to independently perform atom probe experiments, reconstruct their data and carry out in-depth analysis of a variety of different problem sets. Electrochemical- and FIB-sample preparation tutorials are included.