Institute I: General Materials Properties
theme: mechanical testing
AFM-Nanoindenter for investigating the loacl mechanical properties
The device is based on a Hysitron Triboscope nnoindentation head associated to a Bruker Multimode AFM stage, which allows a nanometer-precise positioning. After imaging the surface of the sample in AFM mode, it is possible to select a spot and perform indentation there.
- max force 10 mN
- force resolution 1 nN
- displacement resolution 0.0004 nm