Institute I: General Materials Properties
Dept. Materials Science  —   Faculty of Engineering  —  Friedrich-Alexander-University  —  UnivIS  —  Wiki
Nanoindenter G200
theme: mechanical testing
responsible people:
    →  PD Dr.-Ing. Benoit Merle
    →  M. Sc. Sebastian Krauß
KLA-Tencor Nanoindenter G200 for instrumented indentation testing at room or elevated temperature, scratch testing, and in-situ AFM imaging

With this device, hardness and modulus are evaluated continuously during loading, giving hardness and modulus depth profiles. It is also suitable for dynamic testing of viscoelastic materials up to 45 Hz.

The options installed on this device are:
- continuous stiffness module (CSM)
- XP and DCM-II heads
- nanovision stage (AFM imaging with the indenter)
- high temperature cell (up to 150°C)
- optical microscope
- lateral force sensors
- Nanosuite 6 software

The specifications are:
- max load 500 mN (or 30 mN with DCM-II head)
- depth resolution <0.01 nm
- load resolution 50 nN
- positioning accuracy 1 µm (2 nm with nanovision stage)

stand: 26.06.2020