Institute I: General Materials Properties
Dept. Materials Science  —   Faculty of Engineering  —  Friedrich-Alexander-University  —  UnivIS  —  Wiki
AFM Dimension 3100
theme: microscopy and analysis
responsible people:
    →  PD Dr.-Ing. Benoit Merle
    →  M. Sc. Sebastian Krauß
Atomic Force Microscope for surface investigations

The Bruker (previously Veeco) Dimension 3100 AFM is used on a regular basis for investigating sample surfaces. The spacious design of the device is areal advantage, as it keeps the sample preparation effort low. The AFM support the following operation modes: contact, tapping, magnetic. It is therefore possible to investigate a broad range of samples for topography, friction and magnetic properties.

Specifications:
- z travel range measurement head: 8 µm
- x-y travel range measurement head: 100 µm x 100 µm
- x-y Closed Loop
- max sample height: ~2cm

stand: 05.06.2018